CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms (Microtechnology and MEMS)
| Author | : | |
| Rating | : | 4.80 (812 Votes) |
| Asin | : | 354022680X |
| Format Type | : | paperback |
| Number of Pages | : | 232 Pages |
| Publish Date | : | 2016-04-05 |
| Language | : | English |
DESCRIPTION:
Andrew Jones said Good book, poor Kindle transcription. I refer to this book very frequently and find the information accurate and well written. Unfortunately the Kindle version has been very poorly transcribed, the font looks HORRIBLE, there are many spaces in the middle of words, and many strange symbols (also often in the middle of words). This makes the book very difficult to read on the Kindle, though in time it is possible to to work out what was actually written.
In 1995, he was a Visiting Professor at the Physical Electronics Laboratory, ETH Zürich. His present research interests lie in fabrication of devices, circuits, and systems using disordered semiconductor, including organic, materials on rigid and mechanically flexible substrates for large area electronics. Flora Li received her Bachelor of Applied Science degree in Electrical Engineering from University of Waterloo, Canada
For example, the new generation of semiconductor inspection systems is being pushed to image at increasingly shorter DUV wavelengths to facilitate inspection of deep sub-micron features in integrated circuits. DUV-sensitive charge-coupled device (CCD) cameras are in demand for these applications. Although CCD cameras that are responsive at DUV wavelengths are now available, their long-term stability is still a major concern. This book describes the degradation mechanisms and long-term performance of CCDs in the DUV, along with new results of device performance at these wavelengths.. As the
For example, the new generation of semiconductor inspection systems is being pushed to image at increasingly shorter DUV wavelengths to facilitate inspection of deep sub-micron features in integrated circuits. This book describes the degradation mechanisms and long-term performance of CCDs in the DUV, along with new results of device performance at these wavelengths.. From the Back CoverAs the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are emerging. Although CCD cameras that are responsive at DUV wavelengths are now available, their long-term stability is still a major concern. DUV-sensitive charge-coupled device (CCD) cameras are in demand for these applications